Equipment
Qualiline-C
   
3D microscope
Optronic microscope
Ceramic inspection
   
 

Film thickness measurement

 
  Features:  
 
  1. Range of measure:10nm-400um
  2. Resolution:0.1nm
  3. Measure material:transparent film, half transparent film, and metal film.
  4. For different materials, be through measure multi-storey organization.
  5. Super-mini light-spot:measure film of specific point.
  6. Multi- channel machine, maximum measure points for 8 points.
  7. Specially made detector for measure curved surface.
 
     
     
  KAITRONIC TECHNOLOGY CO., LTD.  
  Add:No.870, Sec. 3, Xinsheng Rd., Zhongli City, Taoyuan County 320, Taiwan  
E-mail:service@kaitronic.com
  TEL:+886-3-453-3569│FAX:+886-3-453-2113