Equipment
ViaCon TFM
   
Qualiline-C
   
Optronic microscope
Ceramic inspection
   
　
 

MikroScan

  
  Features：  
 
 
  1. Fast
  2. Flexible
  3. Precise
  4. Wide application range
  5. Friendly
Measurement speed： up to 120 um/s
Lateral field of view： 0.2x0.2 ~ 15x15 mm2
Lateral resolution： 0.2-15 um
Longitudinal measurement range： up to 300 um
Measurement uncertainty： down to the nm range

 

  
     
     
     
  KAITRONIC TECHNOLOGY CO., LTD.  
  Add：No.870, Sec. 3, Xinsheng Rd., Zhongli City, Taoyuan County 320, Taiwan  
E-mail：mailto:service@kaitronic.com
  TEL：+886-3-453-3569│FAX：+886-3-453-2113